USE OF X-RAY TOPOGRAPHY FOR STUDYING THE REAL STRUCTURE OF НРНT-MONOCRYSTALS OF DIAMOND TYPE IIa

Abstract

Features of the internal structure were studied using X-ray topography and the method of selective etching. Sectional topograms of the crystal were obtained - the original image and its appearance in reverse contrast. The obtained topogram pictures demonstrate the physical faces of the crystal, growth sectors and dislocations that start near the seed crystal and are distributed radially along its outer faces. On the basis of experimental imv reconstructed taking into account their intensity and, thus, the volume of the crystal and the localization of areas of increased intensity were visualized. The given results clearly demonstrate the initial sources of dislocations, which diverge from the seed in bundles, as well as the zonal nature of crystal growth.